Name
Abstract | ||
|---|---|---|
This issue of the Magazine is dedicated to profiling, which is an interesting subject not yet completely explored by metrologists who could really contribute to improve it through their skills and competencies. That is why I have asked some experts in this field to contribute to this issue to share their vision on some specific aspects of profiling. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/MIM.2017.7864540 | IEEE Instrum. Meas. Mag. |
Field | DocType | Volume |
Competence (human resources),Engineering ethics,Profiling (computer programming),Control engineering,Engineering,Multimedia | Journal | 20 |
Issue | Citations | PageRank |
1 | 0 | 0.34 |
References | Authors | |
0 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Veronica Scotti | 1 | 1 | 1.79 |