Title
Self-triggered stacked silicon-controlled rectifier structure (STSSCR) for on-chip electrostatic discharge (ESD) protection.
Abstract
In order to improve the holding voltage and keep the trigger voltage of the silicon controlled rectifier (SCR) devices, a new self-triggered stacked SCR structure (STSSCR) is proposed for on–chip electrostatic discharge (ESD) protection. The STSSCR structure consists of a modified lateral SCR (MLSCR) and multiple double trigger SCRs (DTSCRs). The trigger voltage of the structure is decided by the trigger voltage of the MLSCR. And the holding voltage is decided by the holding voltage of the SCRs and the number of the DTSCR in the STSSCR structure. The simulation and experimental results show that STSSCR has a stable trigger voltage, a small trigger current and an adjustable high holding voltage.
Year
DOI
Venue
2017
10.1016/j.microrel.2016.11.014
Microelectronics Reliability
Keywords
Field
DocType
Electrostatic discharge (ESD) protection,Stacked silicon-controlled rectifier (SSCR),Holding voltage
Rectifier,Electrostatic discharge,Voltage,CMOS,Optoelectronics,Materials science,Silicon-controlled rectifier
Journal
Volume
ISSN
Citations 
71
0026-2714
0
PageRank 
References 
Authors
0.34
0
6
Name
Order
Citations
PageRank
Jizhi Liu100.68
Qian Lingli200.34
Tian Rui300.34
Zhiwei Liu4166.66
Zhao Liu52510.73
Cheng Hui600.68