Title
Contrast of a HDL model and COTS version of a microprocessor for soft-error testing
Abstract
Reliability evaluation of Commercial off-the-shelf (COTS) processors against faults induced by radiation is a challenging problem. Some alternatives have been proposed to radiation test but they are very time consuming and lack of the observability needed. This work analyses the possibility to use an HDL model for estimating applications dependability on Texas Instruments MSP430 processor early in the development phase. Different fault injection methods are used showing the advantages of FPGA emulation over direct injection on real devices. The register file vulnerability is compared and analyzed for each individual register and considering the overall resource. Results show significant similarities in error rate for most used registers and differences in estimation below 9% when the entire register file is considered.
Year
DOI
Venue
2017
10.1109/LATW.2017.7906771
2017 18th IEEE Latin American Test Symposium (LATS)
Keywords
Field
DocType
HDL,COTS reliability,fault tolerance,radiation effects,soft-errors,fault injection
Observability,Dependability,Soft error,Computer science,Word error rate,Microprocessor,Field-programmable gate array,Register file,Fault injection,Embedded system
Conference
ISBN
Citations 
PageRank 
978-1-5386-0416-8
0
0.34
References 
Authors
9
6