Title
EPAT: Euclidean Perturbation Analysis and Transform - An Agnostic Data Adaptation Framework for Improving Facial Landmark Detectors
Abstract
We propose EPAT, (Euclidean Perturbation Analysis and Transform) a novel unsupervised adaptation approach for improving the accuracy of any facial landmark detector by characterizing the stability of landmark prediction on test images. In EPAT, a test image is transformed several times using a set of Euclidean transforms, producing several perturbed images. The black box landmark detector is used to find facial landmarks on each perturbed version of the test image. Subsequently, inverse transforms are applied to the corresponding landmarks in order to map them back to the original image. Mean and variance are calculated for all inversely transformed detection. Mean and variance represent the new ensemble prediction and the sensitivity of the underlying landmark detector, respectively. We also introduce affine variance (AV) of facial landmarks. AV is used as a measure of the stability of the predicted landmarks and a criterion for selecting a good data adaptation model which effectively addresses potential mismatches between test and training data of the underlying landmark detector. EPAT is evaluated using four state-of-the-art landmark detectors on the standard 300W dataset and also incorporated into a face recognition pipeline to show improved recognition accuracy on the challenging IJB-A dataset.
Year
DOI
Venue
2017
10.1109/FG.2017.36
2017 12th IEEE International Conference on Automatic Face & Gesture Recognition (FG 2017)
Keywords
Field
DocType
Euclidean perturbation analysis and transform,agnostic data adaptation framework,facial landmark detectors,unsupervised adaptation,landmark prediction stability,image transformation,perturbed images,black box landmark detector,inverse transforms,ensemble prediction,affine variance,landmarks stability,data adaptation model,EPAT,face recognition pipeline,improved recognition accuracy,IJB-A dataset
Affine transformation,Facial recognition system,Inverse,Computer vision,Artificial intelligence,Euclidean geometry,Black box,Landmark,Detector,Standard test image,Mathematics
Conference
ISSN
ISBN
Citations 
2326-5396
978-1-5090-4024-7
0
PageRank 
References 
Authors
0.34
14
4
Name
Order
Citations
PageRank
Yue Wu133131.69
Wael Abd-Almageed224824.52
stephen rawls3594.08
Premkumar Natarajan487479.46