Title
Frequency Domain Analysis Of Robust Demodulators For High-Speed Atomic Force Microscopy
Abstract
A fundamental but often overlooked component in the z-axis feedback loop of the atomic force microscope (AFM) operated in dynamic mode is the demodulator. Its purpose is to obtain a preferably fast and low-noise estimate of amplitude and phase of the cantilever deflection signal in the presence of sensor noise and additional distinct frequency components. In this paper, we implement both traditional and recently developed robust methods on a LabVIEW digital processing system for high-bandwidth demodulation. The techniques are rigorously compared experimentally in terms of measurement bandwidth, implementation complexity and robustness to noise. We conclude with showing high-speed tapping-mode AFM images in constant height, highlighting the significance of an adequate demodulator bandwidth.
Year
Venue
Field
2017
2017 AMERICAN CONTROL CONFERENCE (ACC)
Frequency domain,Demodulation,Control theory,Cantilever,Computer science,Electronic engineering,Feedback loop,Control engineering,Robustness (computer science),Kalman filter,Bandwidth (signal processing),Amplitude
DocType
ISSN
Citations 
Conference
0743-1619
0
PageRank 
References 
Authors
0.34
2
5