Title
Analysis of two different charge injector candidates for an on-chip Floating Gate recharging system
Abstract
Two different structures as charge injectors for Floating Gate sensors are tested and analysed. First of all the theoretical charge injection processes are exposed and discussed. Secondly experimental results on both structures are presented. The experimental results allow to choose one of the structures as a candidate to be used embedded with the Floating Gate sensor system.
Year
DOI
Venue
2017
10.1109/DTIS.2017.7930181
2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
Keywords
Field
DocType
charge injector,floating gate,direct tunneling,Fowler-Nordheim tunneling,gamma dosimeter
Computer science,Injector,Charge injection,Electronic engineering,Sensor system,Electrical engineering
Conference
ISBN
Citations 
PageRank 
978-1-5090-6378-9
0
0.34
References 
Authors
0
10
Name
Order
Citations
PageRank
J. Cesari100.68
J. Cesari200.68
A. Pineda300.34
S. Danzeca411.07
Alessandro Masi53211.15
M. Brugger600.68
M. Fernandez700.34
Eugeni Isern8569.55
Miquel Roca95613.50
Eugeni García-Moreno1092.81