Name
Abstract | ||
|---|---|---|
•A novel sparse Bayesian algorithm for learning exemplars is proposed.•The proposed method automatically locates exemplars among similar observations.•Applications to data representation and cluster analysis are provided.•Theoretical generalization error bound for the method is provided. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1016/j.patcog.2017.09.002 | Pattern Recognition |
Keywords | Field | DocType |
Representative exemplars,One class Gaussian process regression,Support-based clustering,Automatic relevance determination,Kernel methods | Kriging,Support function,Data set,External Data Representation,Pattern recognition,Regression,Artificial intelligence,Gaussian process,Kernel method,Basis (linear algebra),Mathematics,Machine learning | Journal |
Volume | Issue | ISSN |
74 | C | 0031-3203 |
Citations | PageRank | References |
0 | 0.34 | 27 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Youngdoo Son | 1 | 10 | 3.17 |
| Sujee Lee | 2 | 0 | 0.34 |
| Saerom Park | 3 | 0 | 1.01 |
| Jaewook Lee | 4 | 72 | 8.87 |