Name
Title | ||
|---|---|---|
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1016/j.microrel.2017.08.002 | Microelectronics Reliability |
Field | DocType | Volume |
Systems engineering,Engineering,Electrical engineering,Reliability engineering | Journal | 76 |
ISSN | Citations | PageRank |
0026-2714 | 0 | 0.34 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nathalie Labat | 1 | 9 | 6.41 |
| François Marc | 2 | 9 | 5.39 |
| Hélène Frémont | 3 | 20 | 12.71 |
| M. Bafleur | 4 | 7 | 7.06 |