Name
Title | ||
|---|---|---|
A versatile architecture for long-term monitoring of single-event transient durations. |
Abstract | ||
|---|---|---|
We present design and analysis of an on-chip measurement infrastructure, which facilitates long-term monitoring of single-event transient durations in digital VLSI circuits exposed to uncontrollable radiation. Unlike the known oscilloscope-based methods, our approach is all-digital: SET durations are measured by the SET-gated counting of pulses generated by a high-frequency ring oscillator, and stored in an up/down-counter array organized in a ring. We carefully elaborate a comprehensive concept for making our infrastructure SEU tolerant, with the main challenge being to attain a sufficiently high probability of recording useful hits in the target before exhausting the SEU tolerance of the infrastructure. Our key contribution here concerns the protection of the counter array: Rather than resorting to radiation hardening or explicit triple modular redundancy (TMR), we save area by using a novel redundant duplex counter architecture: For a small number of recorded SETs, our architecture implicitly implements TMR, albeit in a way that degrades gracefully for larger numbers of recorded SETs. Besides standard functional and timing verification, we use Spice-based SET injection for verifying the effectiveness of our SEU-tolerant architecture, and some cross section-based probabilistic analysis for confirming that our measurement infrastructure based on it indeed achieves its purpose. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1016/j.micpro.2017.07.007 | Microprocessors and Microsystems |
Keywords | Field | DocType |
Asynchronous digital VLSI circuits,Ionizing radiation,Single-event transients,Single-event upsets,SET Durations,LFSR Counters,Elastic pipelines,Muller C-elements,Spice models,SET Injection experiments | Small number,Ring oscillator,Oscilloscope,Spice,Computer science,Parallel computing,Triple modular redundancy,Probabilistic analysis of algorithms,Real-time computing,Very-large-scale integration,Radiation hardening | Journal |
Volume | Issue | ISSN |
53 | C | 0141-9331 |
Citations | PageRank | References |
0 | 0.34 | 8 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Varadan Savulimedu Veeravalli | 1 | 13 | 3.72 |
| Andreas Steininger | 2 | 308 | 49.17 |
| Ulrich Schmid | 3 | 31 | 4.58 |