Title
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience).
Abstract
We present cross-layer exploration for architecting resilience, a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, and area) by combining resilience techniques across various layers of the system stack (circuit, logic, archite...
Year
DOI
Venue
2018
10.1109/TCAD.2017.2752705
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Keywords
DocType
Volume
Resilience,Flip-flops,Benchmark testing,Computer architecture,Integrated circuit reliability,Reliability engineering
Journal
37
Issue
ISSN
Citations 
9
0278-0070
3
PageRank 
References 
Authors
0.40
0
11
Name
Order
Citations
PageRank
Eric Cheng1162.97
Shahrzad Mirkhani21279.56
Lukasz G. Szafaryn31417.69
Chen-Yong Cher477039.92
Hyungmin Cho541322.09
Kevin Skadron66188384.18
Mircea R. Stan73103277.34
klas lilja8132.02
J. Abraham94905608.16
Pradip Bose102790210.58
Subhasish Mitra113657228.90