Paper Info
Title
A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification
Abstract
In this paper a highly reliable lightweight PUF scheme is proposed, which is based on current reference source and the deviation of current mirrors. When configuring the deviation current source by applying n input challenges, the PUF circuit can generate 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">n</sup> independent output secret keys correspondingly. Post-layout simulation results show a worst case reliability of 99.27% over the extended temperature range of 40°C to 120°C and 10% fluctuations in supply voltage, indicating a high reliability and effectiveness for secure chip identification.
Year
DOI
Venue
2017
10.1109/ASICON.2017.8252411
2017 IEEE 12th International Conference on ASIC (ASICON)
Keywords
Field
DocType
physical unclonable function,highly reliable,current reference,circuit design
High-definition video,Monte Carlo method,Current mirror,Computer science,Current source,Voltage,Chip,Electronic engineering
Conference
ISSN
ISBN
Citations 
2162-7541
978-1-5090-6626-1
0
PageRank 
References 
Authors
0.34
0
3
Name
Order
Citations
PageRank
Gang Li142179.69
Pengjun Wang26211.93
Yuejun Zhang301.35