Name
Abstract | ||
|---|---|---|
This paper introduces a method to automatically retrieve dates from smart card memory dumps when the card specifications are unknown. It exploits specificities of smart cards, using a multi-dump analysis augmented with contextual information. The experiments performed on more than 180 real smart cards show that our method is highly successful in removing false positives. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/WIFS.2017.8267663 | 2017 IEEE Workshop on Information Forensics and Security (WIFS) |
Keywords | DocType | ISSN |
smart card memory dumps,card specifications,haystack | Conference | 2157-4766 |
ISBN | Citations | PageRank |
978-1-5090-6770-1 | 0 | 0.34 |
References | Authors | |
5 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Thomas Gougeon | 1 | 0 | 0.34 |
| Morgan Barbier | 2 | 0 | 0.34 |
| Patrick Lacharme | 3 | 0 | 0.34 |
| Gildas Avoine | 4 | 978 | 72.39 |
| Christophe Rosenberger | 5 | 595 | 54.83 |