Name
Abstract | ||
|---|---|---|
In this paper, we present a sparse regression (SpaRe) model-based yield analysis methodology and apply it to memory designs with state-of-the-art write-assist circuitry. At the core of its engine is a mixture importance sampling technique which consists of a uniform sampling stage and an importance sampling stage. The proposed methodology allows for fast and accurate statistical analysis of rare f... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TVLSI.2017.2753139 | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Keywords | Field | DocType |
Monte Carlo methods,Integrated circuit modeling,Analytical models,Predictive models,Radio frequency,Data models,Random access memory | Data modeling,Importance sampling,Computer science,Electronic engineering,Artificial intelligence,Rare events,Speedup,Data point,Monte Carlo method,Pattern recognition,Algorithm,Static random-access memory,Sampling (statistics) | Journal |
Volume | Issue | ISSN |
26 | 1 | 1063-8210 |
Citations | PageRank | References |
0 | 0.34 | 11 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Maria Malik | 1 | 103 | 8.81 |
| Rajiv V. Joshi | 2 | 260 | 64.87 |
| Rouwaida Kanj | 3 | 262 | 29.95 |
| Shupeng Sun | 4 | 66 | 5.35 |
| Houman Homayoun | 5 | 579 | 69.64 |
| Li Tong | 6 | 87 | 41.87 |