Name
Abstract | ||
|---|---|---|
The security of embedded devices has attracted attention. Lightweight block ciphers are effective for the security of embedded devices because it can be implemented in small area. Regarding security, the threat of fault analysis for a cryptographic circuit has been reported. Fault analysis analyzes the confidential information illegally. To ensure the security of embedded devices, the research against fault analysis for a lightweight block cipher circuit is very important. This study proposed a new fault analysis method for TWINE which is one of the most popular lightweight block ciphers. Experiments using a FPGA show the validity of the proposed method. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1109/GCCE.2015.7398568 | 2015 IEEE 4th Global Conference on Consumer Electronics (GCCE) |
Keywords | Field | DocType |
security of embedded devices,TWINE,fault analysis,cyptographic circuit | Fault analysis,Block cipher,Cryptography,Computer science,Field-programmable gate array,Embedded system | Conference |
Citations | PageRank | References |
0 | 0.34 | 2 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nozaki, Y. | 1 | 5 | 11.62 |
| Kensaku Asahi | 2 | 1 | 3.78 |
| Masaya Yoshikawa | 3 | 25 | 23.93 |