Abstract | ||
---|---|---|
The paper analyses the trend in packaging for low-power integrated circuits (IC) and the principal failures that can occur. A Fault-tree (FT) analysis is proposed, as well an analysis of the failure distribution (FD), which can be useful in safety-critical applications such as industrial and automotive. |
Year | DOI | Venue |
---|---|---|
2016 | 10.1007/978-3-319-55071-8_21 | Lecture Notes in Electrical Engineering |
Keywords | DocType | Volume |
Failure mode and effect analysis (FMEA),Functional safety,Automotive electronics,Integrated Circuits (ICs),Packaging | Conference | 429 |
ISSN | Citations | PageRank |
1876-1100 | 0 | 0.34 |
References | Authors | |
0 | 3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Sergio Saponara | 1 | 392 | 58.59 |
Gabriele Ciarpi | 2 | 0 | 2.03 |
Luca Fanucci | 3 | 532 | 82.83 |