Paper Info
Title
Multivariate multiple regression modelling for technology analysis.
Abstract
Technology analysis is important for technology management areas such as research and development strategy and new product development. So many studies on technology analysis have been used across a diverse array of fields. Most of these were based on patent analysis, which analyses patent documents using text mining and statistics. The studies on conventional patent analyses constructed models consisting of various independent variables (technologies) and one dependent variable. But in reality, we have to consider a model that includes several dependent variables at the same time, because most technologies influence each other. In this paper, we propose a methodology for patent analysis that reflects the various response technologies simultaneously. We perform multivariate multiple regression modelling in order to efficiently conduct our technology analysis. To show how our modelling can be applied to realistic context, we carry out a case study using the patent documents related to three-dimensional printing technology.
Year
DOI
Venue
2018
10.1080/09537325.2017.1309015
TECHNOLOGY ANALYSIS & STRATEGIC MANAGEMENT
Keywords
Field
DocType
Multivariate multiple regression,technology analysis,three-dimensional printing,management of technology
Data mining,Economics,Multivariate statistics,Variables,Patent analysis,Three dimensional printing,Technology management,Linear regression,New product development
Journal
Volume
Issue
ISSN
30.0
3
0953-7325
Citations 
PageRank 
References 
0
0.34
9
Authors
3
Name
Order
Citations
PageRank
Sung-Hae Jun19511.79
Jacob Wood261.81
Sang-Sung Park3807.25