Name
Title | ||
|---|---|---|
Stochastic degradation process modeling and remaining useful life estimation with flexible random-effects. |
Year | Venue | DocType |
|---|---|---|
2017 | J. Franklin Institute | Journal |
Volume | Issue | Citations |
354 | 6 | 0 |
PageRank | References | Authors |
0.34 | 0 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Zheng-Xin Zhang | 1 | 119 | 9.12 |
| C. H. Chang | 2 | 428 | 36.69 |
| Xiao-Sheng Si | 3 | 623 | 46.17 |
| Jianxun Zhang | 4 | 0 | 1.35 |
| Jian-Fei Zheng | 5 | 9 | 3.18 |