Name
Abstract | ||
|---|---|---|
Diagnosis is the first analysis step for uncovering the root cause of failure for a defective integrated logic circuit. The conventional objective of identifying failure locations has been augmented with various physically-aware diagnosis techniques that are intended to improve both resolution and accuracy. Despite these advances, it is often the case, however, that resolution, i.e., the number of... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TCAD.2016.2611499 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | Field | DocType |
Sociology,Statistics,Circuit faults,Support vector machines,Feature extraction,Predictive models,Training | Logic gate,Computer science,Support vector machine,Feature extraction,Artificial intelligence,Root cause,Machine learning | Journal |
Volume | Issue | ISSN |
37 | 6 | 0278-0070 |
Citations | PageRank | References |
2 | 0.38 | 21 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yang Xue | 1 | 20 | 2.92 |
| Xin Li | 2 | 530 | 60.02 |
| R. D. (Shawn) Blanton | 3 | 644 | 66.70 |