Title
Large scale RO PUF analysis over slice type, evaluation time and temperature on 28nm Xilinx FPGAs
Abstract
Runtime accessible, general purpose, secure secret storage based on physical unclonable functions (PUFs) implemented within the programmable logic fabric is one of the most interesting applications of PUFs on field programmable gate arrays (FPGAs). To properly evaluate the quality of a PUF design, data from a large number of devices is required. This work therefore publishes a dataset containing 100 repeated measurements of 6592 ring oscillators (ROs) on 217 Xilinx Artix-7 XC7A35T FPGAs. This is both larger, and based on a more recent technology node than other publicly available datasets of related work. Apart from making the raw data publicly available, a thorough analysis is performed. The location and type of slice is found to affect the RO frequency by approx. 5 MHz, fast switching logic decreases the frequency by approx. 10MHz, and ROs adjacent to clock routing resources showed an expected frequency of 20 MHz less than others on the device. We also address the time-to-response of ring oscillator PUFs (RO-PUFs), which can be large, by optimizing the evaluation time with regard to the measurement precision and found 70.71 μs to be optimal for the device and architecture under test. The temperature induced bit error rate was estimated to be 3.5 % and 5.8 % for temperature differences of 60 °C and 100 °C respectively. Finally, access to the FPGA array used to obtain the data will be granted to interested researchers.
Year
DOI
Venue
2018
10.1109/HST.2018.8383900
2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
Keywords
Field
DocType
PUF analysis,secure secret storage,physical unclonable functions,programmable logic fabric,field programmable gate arrays,time-to-response,ring oscillator PUFs,RO-PUFs,FPGA array,Xilinx FPGAs,temperature 60.0 degC,temperature 100.0 degC,size 28.0 nm
Wafer,Ring oscillator,Approx,General purpose,Computer science,Field-programmable gate array,Electronic engineering,Computer hardware,Temperature measurement,Bit error rate,Programmable logic device
Conference
ISBN
Citations 
PageRank 
978-1-5386-4732-5
3
0.46
References 
Authors
12
4
Name
Order
Citations
PageRank
Robert Hesselbarth1111.65
Florian Wilde2102.37
Chongyan Gu3469.79
Neil Hanley416114.45