Name
Abstract | ||
|---|---|---|
This special issue of this issue is about test and reliability of automotive electronics. It seems from looking at the papers that many of our test techniques work quite well in cars. Sure, the environment under the hood is even harsher than what my smartphone goes through in the pocket of my shirt. The consequences of failure are much greater, also. As are the constraints. Our PCs can freeze when... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/MDAT.2018.2816922 | IEEE Design & Test |
DocType | Volume | Issue |
Journal | 35 | 3 |
ISSN | Citations | PageRank |
2168-2356 | 0 | 0.34 |
References | Authors | |
0 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Scott Davidson | 1 | 56 | 22.93 |