Name
Title | ||
|---|---|---|
Specification analysis of the deteriorating sensor for required lifetime prognostic performance. |
Abstract | ||
|---|---|---|
Lifetime prognostic based on the degradation data has been widely investigated and adopted for reliability assessment and maintenance policy. However, the measurement error (ME) is usually inevitable, which leads to the bias of lifetime estimation and erroneous evaluation of the safety risk. In this paper, we mainly focus on an inverse issue: how to specify the sensor's performance (i.e., the ME range) for satisfying a given requirement of the lifetime estimation. Under this consideration, we first analyze the probability distribution functions of the lifetime estimation with/without the ME based on Wiener process degradation model. Then a distance measure based on the relative entropy is formulated to evaluate the difference between these two lifetime estimations. Furthermore, the permissible ranges of the time-dependent and time-independent ME are attained under a given allowable bias of lifetime estimation according to the proposed distance measure. In addition, the influence of the ME on maintenance policy is discussed. Finally, numerical examples and a case study are provided to illustrate. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1016/j.microrel.2018.04.004 | Microelectronics Reliability |
Keywords | Field | DocType |
Measurement error,Relative entropy,Wiener process,Lifetime estimation,Reliability | Wiener process,Inverse,Probability distribution,Engineering,Kullback–Leibler divergence,Reliability engineering,Observational error | Journal |
Volume | ISSN | Citations |
85 | 0026-2714 | 1 |
PageRank | References | Authors |
0.35 | 12 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jian-Xun Zhang | 1 | 49 | 6.42 |
| Xiao-Sheng Si | 2 | 623 | 46.17 |
| Dang-Bo Du | 3 | 11 | 3.91 |
| C. H. Chang | 4 | 428 | 36.69 |