Name
Title | ||
|---|---|---|
SPSIM: A Superpixel-Based Similarity Index for Full-Reference Image Quality Assessment |
Abstract | ||
|---|---|---|
Full-reference image quality assessment algorithms usually perform comparisons of features extracted from square patches. These patches do not have any visual meanings. On the contrary, a superpixel is a set of image pixels that share similar visual characteristics and is thus perceptually meaningful. Features from superpixels may improve the performance of image quality assessment. Inspired by th... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TIP.2018.2837341 | IEEE Transactions on Image Processing |
Keywords | Field | DocType |
Feature extraction,Image color analysis,Image quality,Visualization,Indexes,Image segmentation,Distortion measurement | Computer vision,Quality Score,Pattern recognition,Visualization,Chrominance,Image quality,Image segmentation,Feature extraction,Pixel,Artificial intelligence,Luminance,Mathematics | Journal |
Volume | Issue | ISSN |
27 | 9 | 1057-7149 |
Citations | PageRank | References |
8 | 0.44 | 10 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sun Wen | 1 | 30 | 1.81 |
| QM | 2 | 464 | 72.05 |
| Jing-Hao Xue | 3 | 393 | 46.48 |
| Fei Zhou | 4 | 29 | 8.98 |