Name
Abstract | ||
|---|---|---|
In this work, a new method to design a mixed-mode Test Pattern Generator (TPG) based only on a simple and single Linear Feedback Shift Register (LFSR) is described. Such an LFSR is synthesized by Berlekamp–Massey algorithm (BMA) and is capable of generating pre-computed deterministic test patterns which detect the hard-to-detect faults of the circuit. Moreover, the LFSR generates residual patterns which are sufficient to detect the remaining easy-to-detect faults. In this way, the BMA-designed LFSR is a mixed-mode TPG which achieves total fault coverage with short testing length and low hardware overhead compared with previous schemes according to the experimental results. |
Year | DOI | Venue |
|---|---|---|
2010 | https://doi.org/10.1007/s10836-010-5155-x | Journal of Electronic Testing |
Keywords | Field | DocType |
BIST,Mixed-mode TPG,LFSR,Berlekamp–Massey algorithm | Residual,Linear feedback shift register,Fault coverage,Computer science,Parallel computing,Algorithm,Real-time computing,Test pattern generators,Berlekamp–Massey algorithm,Deterministic testing | Journal |
Volume | Issue | ISSN |
26 | 4 | 0923-8174 |
Citations | PageRank | References |
0 | 0.34 | 8 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Cleonilson Protásio de Souza | 1 | 7 | 2.28 |
| Francisco Marcos de Assis | 2 | 3 | 3.97 |
| Raimundo Carlos Silvério Freire | 3 | 13 | 6.97 |