Paper Info
Title
Orientation and analysis of XFEL serial diffraction patterns from fibrous molecular assemblies
Abstract
The application of high-powered X-ray Free Electron Lasers (XFELs) in Serial Femtosecond Crystallography (SFX) has led to an increasing number of crystal structure determinations. Achieving the same success for systems of diminished crystallinity, such as fibrous systems and single particles, is inhibited by low signal strength and difficulties in orientating the data. We present methods developed for analyzing serial diffraction data from fibrous systems. The data are processed to identify cases where a single XFEL pulse intersects a single fibril. The fibril orientations are then determined by analysis of detected features within the diffraction data. With the fibril orientation determined, serial diffraction data is merged in 3D reciprocal space, allowing the individual structure amplitudes to be calculated. This allows structural studies of previously inaccessible fibrous systems to be performed, and represents a step closer towards the long-term goal of imaging single particles.
Year
DOI
Venue
2017
10.1109/IVCNZ.2017.8402508
2017 International Conference on Image and Vision Computing New Zealand (IVCNZ)
Keywords
Field
DocType
X-ray diffraction,XFEL,crystallography,fiber,imaging,biological system
Femtosecond,X-ray crystallography,Pattern recognition,Computer science,Optics,Crystal,Crystal structure,Artificial intelligence,Crystallinity,Fibril,Diffraction,Reciprocal lattice
Conference
ISSN
ISBN
Citations 
2151-2191
978-1-5386-4277-1
0
PageRank 
References 
Authors
0.34
0
8
Name
Order
Citations
PageRank
David H. Wojtas101.35
Kartik Ayyer200.68
Mengning Liang300.34
Estelle Mossou400.68
Carolin Seuring500.68
V. Trevor Forsyth600.34
Henry N. Chapman71176.06
Rick P. Millane844.83