Paper Info
Title
Replication-Based Deterministic Testing of 2-Dimensional Arrays with Highly Interrelated Cells
Abstract
In this paper a new method for parallel testing of 2- dimensional arrays is proposed, where test generation is combined with simultaneous circuit partitioning driven by generated test data. The generated tests combine pseudo-exhaustive patterns with deterministic test sequences and are well structured to allow high rate of replication. The test data have a compact structure to be easily unfolded, and they are suitable for implementation as both, software or hardware based BIST. The proposed method targets a large class of sequential (stuck- open and delay) faults and combinational multiple faults. The feasibility of the method is demonstrated by generated test sequences and simulated BIST solutions for array multipliers.
Year
DOI
Venue
2018
10.1109/DDECS.2018.00011
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Keywords
Field
DocType
Two-dimensional array testing,multiplier test,data-controlled circuit partition,test replication,built-in self-test
Computer science,Real-time computing,Software,Test data,Computer engineering,Deterministic testing,Built-in self-test
Conference
ISBN
Citations 
PageRank 
978-1-5386-5755-3
0
0.34
References 
Authors
10
3
Name
Order
Citations
PageRank
Siavoosh Payandeh Azad1116.94
Adeboye Stephen Oyeniran243.47
Raimund Ubar331557.52