What You Corrupt Is Not What You Crash: Challenges in Fuzzing Embedded Devices. - Citegraph

Paper Info

Title
What You Corrupt Is Not What You Crash: Challenges in Fuzzing Embedded Devices.

Year	Venue	Field
2018	NDSS	Crash,Fuzz testing,Computer science,Computer security,Embedded system
DocType	Citations	PageRank
Conference	2	0.35
References	Authors
21	5

Authors (5 rows)

Cited by (2 rows)

References (21 rows)

Name	Order	Citations	PageRank
Marius Muench	1	2	0.35
Jan Stijohann	2	2	0.35
Frank Kargl	3	1090	102.50
Aurélien Francillon	4	812	45.60
Davide Balzarotti	5	2040	113.64

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