Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. - Citegraph

Paper Info

Title
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.

Year	Venue	DocType
2018	Microelectronics Reliability	Journal
Volume	Citations	PageRank
87	0	0.34
References	Authors
0	13

Authors (13 rows)

Cited by (0 rows)

References (0 rows)

Name	Order	Citations	PageRank
Yuanqing Li	1	1	1.39
Li Chen	2	86	38.40
Issam Nofal	3	0	1.01
Mo Chen	4	108	16.04
H. Wang	5	84	15.66
Rui Liu	6	92	19.60
Qingyu Chen	7	25	11.77
Milos Krstic	8	170	39.42
Shuting Shi	9	0	0.34
Gang Guo	10	2	3.43
Sang H. Baeg	11	0	0.34
Shi-Jie Wen	12	114	17.64
Richard Wong	13	61	9.73

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