Title
Metric Driven Classification: A Non-Parametric Approach Based on the Henze-Penrose Test Statistic.
Abstract
Entropy-based divergence measures have proven their effectiveness in many areas of computer vision and pattern recognition. However, the complexity of their implementation might be prohibitive in resource-limited applications, as they require estimates of probability densities which are expensive to compute directly for high-dimensional data. In this paper, we investigate the usage of a non-parame...
Year
DOI
Venue
2018
10.1109/TIP.2018.2862352
IEEE Transactions on Image Processing
Keywords
Field
DocType
Probability density function,Training data,Feature extraction,Pattern recognition,Nearest neighbor methods
Training set,Divergence,Pattern recognition,Test statistic,Measurement uncertainty,Nonparametric statistics,Feature extraction,Artificial intelligence,Probability density function,Mathematics
Journal
Volume
Issue
ISSN
27
12
1057-7149
Citations 
PageRank 
References 
0
0.34
8
Authors
4
Name
Order
Citations
PageRank
Sally Ghanem100.68
Hamid Krim252059.69
Hamilton Scott Clouse310.77
Wesam Sakla4141.95