Title | ||
---|---|---|
A Quadrature Phase Detector in 28nm CMOS for Differential mm-Wave Sensing Applications Using Dielectric Waveguides. |
Abstract | ||
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This paper presents a quadrature phase detector in 28nm CMOS, which is used to perform a differential phase measurement between two dielectric waveguides at 120 GHz. The phase detector has on-chip quadrature generation with a measured maximum quadrature error of 2 degrees over a 20 GHz bandwidth. The quadrature phase detector achieves a maximum uncalibrated phase error of 11 degrees . The proposed waveguide sensing system allows for both intrinsic measurements, in which the dielectric waveguide acts as a sensor, and extrinsic measurements, where the dielectric waveguide acts as a guided channel and antenna. Intrinsic sensing is demonstrated by a temperature measurement and extrinsic with a non-destructive test of a 3Dprinted polymer sample. |
Year | Venue | Keywords |
---|---|---|
2018 | Proceedings of the European Solid-State Circuits Conference | phase detector,quadrature,sensing,dielectric waveguide,mm-wave,CMOS |
Field | DocType | ISSN |
Computer science,Dielectric,Differential phase,Waveguide,Optics,Electronic engineering,CMOS,Bandwidth (signal processing),Phase detector,Quadrature (mathematics),Temperature measurement | Conference | 1930-8833 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Bart Philippe | 1 | 0 | 1.01 |
Patrick Reynaert | 2 | 463 | 76.50 |