Name
Abstract | ||
|---|---|---|
Y-source inverter has been proposed for a few years, but it inherits many problems from coupled-inductor impedance-source inverters (CISIs). So, many studies to address the issues of traditional Y-source inverter have been carried out. However, the reliability of a field working Y-source inverter has never been studied. In this paper, a modified topology of Y-source inverter is proposed which can solve the problem of discontinuous input current and increase boost ratio. The reliability of the proposed modified Y-source inverter (M-YSI) is studied using Physics-of-Failure approach. The lifetime of the proposed topology is predicted under a real mission profile in photo-voltaic application. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1016/j.microrel.2018.07.063 | MICROELECTRONICS RELIABILITY |
Keywords | Field | DocType |
Reliability,Lifetime prediction,Fatigue analysis,Y-source inverter | Inverter,Field working,Electronic engineering,Engineering | Journal |
Volume | ISSN | Citations |
88-90 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 5 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hongpeng Liu | 1 | 4 | 1.82 |
| Wentao Wu | 2 | 5 | 2.53 |
| Hui Wu | 3 | 8 | 3.52 |
| guihua liu | 4 | 1 | 0.75 |
| Panbao Wang | 5 | 0 | 0.34 |
| Wei Wang | 6 | 23 | 8.30 |