Title
Failure analysis on 14 nm FinFET devices with ESD CDM failure.
Year
Venue
DocType
2018
Microelectronics Reliability
Journal
Volume
Citations 
PageRank 
88
0
0.34
References 
Authors
0
9
Name
Order
Citations
PageRank
Shaalini Chithambaram100.34
Pik Kee Tan201.01
Yuzhe Zhao301.01
Binghai Liu400.34
Yinzhe Ma500.34
Alfred Quah600.34
Dayanand Nagalingam700.34
Yanlin Pan800.34
Z. H. Mai914.34