Title
Solving 28 nm I/O circuit reliability issue due to IC design weakness.
Year
Venue
DocType
2018
Microelectronics Reliability
Journal
Volume
Citations 
PageRank 
88
0
0.34
References 
Authors
0
5
Name
Order
Citations
PageRank
Yi Chao Low100.34
Pik Kee Tan201.01
Soon Leng Tan300.34
Yuzhe Zhao401.01
Jeffrey Lam511.64