Name
Title | ||
|---|---|---|
Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic Temperatures |
Abstract | ||
|---|---|---|
The design of cryogenic interface electronics enabling future scalable quantum computers requires the accurate characterization and modeling of nanometer CMOS processes at cryogenic temperatures. To this end, this paper presents the mismatch characterization of 40-nm bulk CMOS transistors over the temperature range from 300 K down to 4.2 K. Measured data confirm that variability increases at cryogenic temperatures, and analysis of such data proves the validity of both the Pelgrom and the Croon models, which describe the mismatch dependency on device area and bias conditions, respectively. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/ESSDERC.2018.8486859 | 2018 48th European Solid-State Device Research Conference (ESSDERC) |
Keywords | Field | DocType |
mismatch characterization,cryogenic temperatures,Croon models,cryogenic interface electronics,nanometer CMOS processes,CMOS transistors,quantum computers,temperature 300.0 K,temperature 4.2 K | Nanometer cmos,Atmospheric temperature range,Semiconductor device modeling,Quantum computer,Cryogenics,Electronic engineering,CMOS,Electronics,Transistor,Optoelectronics,Materials science | Conference |
ISSN | ISBN | Citations |
1930-8876 | 978-1-5386-5402-6 | 4 |
PageRank | References | Authors |
0.65 | 3 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| P. A. 't Hart | 1 | 4 | 0.65 |
| jeroen van dijk | 2 | 43 | 7.00 |
| Masoud Babaie | 3 | 195 | 25.05 |
| Edoardo Charbon | 4 | 385 | 74.69 |
| A. Vladimircscu | 5 | 4 | 0.65 |
| Fabio Sebastiano | 6 | 158 | 29.99 |