Title
Simplified Thermal Modeling for IGBT Modules With Periodic Power Loss Profiles in Modular Multilevel Converters.
Abstract
One of the future challenges in modular multilevel converters (MMCs) is how to size key components with compromised costs and design margins, while fulfilling specific reliability targets. It demands better thermal modeling compared to the state-of-the-arts in terms of both accuracy and simplicity. Different from two-level power converters, MMCs have inherent dc-bias in arm currents and the power ...
Year
DOI
Venue
2019
10.1109/TIE.2018.2823664
IEEE Transactions on Industrial Electronics
Keywords
Field
DocType
Insulated gate bipolar transistors,Junctions,Thermal stresses,Estimation,Stress,Reliability engineering
Thermal,Power semiconductor device,Converters,Power loss,Insulated-gate bipolar transistor,Control engineering,Modular design,Engineering,Periodic graph (geometry),Benchmarking
Journal
Volume
Issue
ISSN
66
3
0278-0046
Citations 
PageRank 
References 
1
0.41
0
Authors
5
Name
Order
Citations
PageRank
Yi Zhang127016.65
Huai Wang22210.05
Zhongxu Wang311.09
Yongheng Yang43015.47
Frede Blaabjerg51195248.32