Title
Microscopic Three-Dimensional Measurement Based on Telecentric Stereo and Speckle Projection Methods.
Abstract
Three-dimensional (3D) measurement of microstructures has become increasingly important, and many microscopic measurement methods have been developed. For the dimension in several millimeters together with the accuracy at sub-pixel or sub-micron level, there is almost no effective measurement method now. Here we present a method combining the microscopic stereo measurement with the digital speckle projection. A microscopy experimental setup mainly composed of two telecentric cameras and an industrial projection module is established and a telecentric binocular stereo reconstruction procedure is carried out. The measurement accuracy has firstly been verified by performing 3D measurements of grid arrays at different locations and cylinder arrays with different height differences. Then two Mitutoyo step masters have been used for further verification. The experimental results show that the proposed method can obtain 3D information of the microstructure with a sub-pixel and even sub-micron measuring accuracy in millimeter scale.
Year
DOI
Venue
2018
10.3390/s18113882
SENSORS
Keywords
Field
DocType
microscopic measurement,stereo vision,telecentric cameras,speckle projection
Speckle pattern,Optics,Electronic engineering,Engineering
Journal
Volume
Issue
ISSN
18
11.0
1424-8220
Citations 
PageRank 
References 
0
0.34
6
Authors
5
Name
Order
Citations
PageRank
Kepeng Chen100.68
Tielin Shi29017.20
Quan Liu32812.17
Zirong Tang400.34
Guanglan Liao5369.69