Title
Remote sensing based yield monitoring: Application to winter wheat in United States and Ukraine.
Abstract
•We present a new method to monitor wheat yield using daily MODIS DVI.•We test the model over the USA and Ukraine from 2001 to 2017.•We can monitor the yield at the subnational level with a RMSE lower than 0.6 MT/ha.•The RMSE at the national scale is 0.1 MT/ha for the US and 0.2 MT/ha for Ukraine.•The model captures low winter wheat yields during years with extreme weather events.
Year
DOI
Venue
2019
10.1016/j.jag.2018.11.012
International Journal of Applied Earth Observation and Geoinformation
Keywords
Field
DocType
Yield model,MODIS,DVI,Evaporative Fraction
Moderate-resolution imaging spectroradiometer,Crop yield,Remote sensing,Extreme weather,Mean squared error,Agriculture,Earth observation,Pixel,Coefficient of determination,Geography
Journal
Volume
ISSN
Citations 
76
0303-2434
2
PageRank 
References 
Authors
0.39
10
7
Name
Order
Citations
PageRank
Belen Franch1287.80
Eric F. Vermote2526109.24
Sergii Skakun313017.69
Jean-Claude Roger4297.56
Inbal Becker-Reshef513220.16
Emilie Murphy691.79
Christopher Justice747997.57