Title
Data-Driven Iterative Feedforward Tuning for a Wafer Stage: A High-Order Approach Based on Instrumental Variables.
Abstract
The feedforward controller plays an important role in the achievement of high servo performance of wafer scanning. In this paper, a novel data-driven feedforward tuning method is developed in the presence of noise. Three distinguished features make it different from the existing methods: first, high extrapolation capability to tasks; second, low requirement on the system model; and especially, thi...
Year
DOI
Venue
2019
10.1109/TIE.2018.2842756
IEEE Transactions on Industrial Electronics
Keywords
Field
DocType
Feedforward systems,Task analysis,Tuning,Iterative methods,Instruments,Data models,Servomotors
Convergence (routing),Data modeling,Control theory,Iterative method,Control theory,Integrator,Engineering,Sensitivity (control systems),System model,Feed forward
Journal
Volume
Issue
ISSN
66
4
0278-0046
Citations 
PageRank 
References 
0
0.34
0
Authors
5
Name
Order
Citations
PageRank
Fazhi Song122.10
Yang Liu222.55
Jian-Xin Xu332437.81
Xiaofeng Yang411.37
Qiao Zhu5162.10