Name
Abstract | ||
|---|---|---|
Measuring impedance accurately requires dedicated fixturing to match the geometry of the device under test to the ports of the instrument. These fixtures introduce error into collected measurements which is rarely acknowledged. Failure to quantify measurement error can lead to over-estimation of accuracy, increase the difficulty of measurement comparisons taken with different fixtures, and increas... |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/TIM.2018.2838858 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Impedance,Impedance measurement,Instruments,Calibration,Bridge circuits,Standards,Measurement uncertainty | Test fixture,Device under test,Fixture,Measurement uncertainty,Electronic engineering,Electrical impedance,Resistor,Calibration,Mathematics,Observational error | Journal |
Volume | Issue | ISSN |
68 | 1 | 0018-9456 |
Citations | PageRank | References |
1 | 0.39 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Blake W. Nelson | 1 | 1 | 0.39 |
| Andrew Lemmon | 2 | 1 | 0.72 |
| Brian T. DeBoi | 3 | 1 | 0.39 |
| Todd J. Freeborn | 4 | 109 | 14.27 |