Name
Abstract | ||
|---|---|---|
The Large Hadron Collider experiments at CERN will use power distribution schemes relying on integrated buck DCIDC converters. Due to the radiation-hardness requirements, the devices used for the development of such converters will have a voltage rating which is close to the converters' input voltage. The voltage spikes generated during the hard-switching operation can affect the reliability of such low-voltage MOSFETs. A fixed and sufficiently small gate driver current for the high-side switch could be used to guarantee the reliable operation even in the worst-case conditions in terms of input voltage, output current, temperature and process variations. Nevertheless, this would result in a suboptimal efficiency in all the other working conditions. This work presents an integrated system than monitors in real-time the voltage stress, and adjusts the gate driver current to achieve maximum efficiency in all conditions, while ensuring compliance with the reliability specifications. A buck converter including the voltage peak detector and an adjustable gate driver current has been designed in a 130 nm technology, demonstrating the functionality of the voltage stress monitoring system. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/NEWCAS.2018.8585694 | 2018 16th IEEE International New Circuits and Systems Conference (NEWCAS) |
Keywords | Field | DocType |
DC-DC power conversion,Integrated circuit reliability | Voltage spike,Large Hadron Collider,Computer science,Voltage,Converters,Electronic engineering,Precision rectifier,MOSFET,Buck converter,Gate driver | Conference |
ISSN | ISBN | Citations |
2472-467X | 978-1-5386-4860-5 | 0 |
PageRank | References | Authors |
0.34 | 0 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Giacomo Ripamonti | 1 | 0 | 0.68 |
| s michelis | 2 | 3 | 1.78 |
| Federico Faccio | 3 | 10 | 4.29 |
| Stefano Saggini | 4 | 14 | 3.08 |
| Adil Koukab | 5 | 6 | 4.75 |
| Maher Kayal | 6 | 60 | 34.46 |