Name
Abstract | ||
|---|---|---|
In this paper, the concept of homogeneity is defined, from a topological perspective, in order to analyze how uniform is the material composition in 2D electron microscopy images. Topological multiresolution parameters are taken into account to obtain better results than classical techniques. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1007/978-3-030-10828-1_13 | CTIC |
Field | DocType | Citations |
Topology,Homogeneity (statistics),Computer science,Electron microscope | Conference | 0 |
PageRank | References | Authors |
0.34 | 2 | 9 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Helena Molina-Abril | 1 | 82 | 10.87 |
| Fernando Díaz del Río | 2 | 16 | 5.95 |
| Maria De La Paz Guerrero-Lebrero | 3 | 0 | 0.68 |
| Pedro Real | 4 | 267 | 35.40 |
| Guillermo Bárcena-Gonzalez | 5 | 0 | 0.34 |
| Veronica Braza | 6 | 0 | 0.34 |
| Elisa Guerrero Vázquez | 7 | 30 | 16.90 |
| David Gonzalez | 8 | 95 | 7.49 |
| Pedro L. Galindo | 9 | 31 | 17.93 |