Name
Abstract | ||
|---|---|---|
This work reports a fault tolerant design for the high density resistive memories. It addresses the limitation of low cell reliability of resistive memories and the restricted write endurance. The faulty and worn-out cells of a memory module are identified on-line to recover from the damage caused during the life time of a chip. Von Neumann's theory of cellular automata has been used as a basis of the reported design. The single length cycle cellular automata (SACA) is synthesized to capture the erronous recording in a memory cell during a write and memorizes the stuck-at value stored there of. It enables effective retrieval of data during a read, that is desired for the high density resistive memories. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/ISED.2016.7977077 | 2016 Sixth International Symposium on Embedded Computing and System Design (ISED) |
Keywords | Field | DocType |
Resistive memory,cellular automata,fault tolerance,SACA | Cellular automaton,Computer science,Resistive touchscreen,Parallel computing,Chip,Fault tolerance,Computer hardware,Von Neumann architecture,Memory cell,Memory module,Resistive random-access memory | Conference |
ISBN | Citations | PageRank |
978-1-5090-2542-8 | 0 | 0.34 |
References | Authors | |
0 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mousumi Saha | 1 | 2 | 4.13 |
| Sutapa Sarkar | 2 | 0 | 0.34 |
| Biplab K. Sikdar | 3 | 217 | 40.85 |