Paper Info
Title
A Current Comparator Based Physical Unclonable Function with High Reliability and Energy Efficiency.
Abstract
In this paper, we present a novel physical unclonable function (PUF) based on the current comparator. This design converts the process variation of the current comparator’s internal transistors to a 1-bit digital output. By introducing the proportional to absolute temperature (PTAT) and positive feedback mechanisms, the reliability of the proposed implementation is significantly enhanced. In addition, the proposed design has been validated by our extensive post-layout simulations using 65nm CMOS technology. With the working temperature varying from $-40^{circ}C$ to 120° C and the supply voltage varying from 1.0V to 1.4V, the average reliability is reported to be 99.05% and the uniqueness is 49.96%, respectively. Featuring a compact silicon area of 2533$mu m ^{2}$, the entire circuitry consumes 1.65 pJ/bit at a throughput of 10 Mb/s. Moreover, the superior unpredictability of this design is verified by passing NIST randomness test.
Year
DOI
Venue
2018
10.1109/ICDSP.2018.8631575
DSL
Field
DocType
Citations 
Computer vision,Comparator,Computer science,Voltage,CMOS,Electronic engineering,Randomness tests,NIST,Process variation,Artificial intelligence,Physical unclonable function,Transistor
Conference
0
PageRank 
References 
Authors
0.34
0
4
Name
Order
Citations
PageRank
Qiang Zhao141.75
Yuan Cao25414.46
Xiaojin Zhao345.48
Chip-Hong Chang41160123.27