Abstract | ||
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We introduce an algorithm for dynamic lifetime reliability optimization of chip multiprocessors (CMPs). The proposed dynamic reliability management (DRM) algorithm combines thread migration and dynamic voltage and frequency scaling (DVFS) as the two primary techniques to change the CMP operation. The goal is to increase the lifetime reliability of the overall system to the desired target with mini... |
Year | DOI | Venue |
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2018 | 10.1109/TMSCS.2018.2870187 | IEEE Transactions on Multi-Scale Computing Systems |
Keywords | DocType | Volume |
Reliability,Network-on-chip,Multicore processing,Dielectric breakdown,Benchmark testing,Negative bias temperature instability | Journal | 4 |
Issue | ISSN | Citations |
4 | 2332-7766 | 0 |
PageRank | References | Authors |
0.34 | 0 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Milad Ghorbani Moghaddam | 1 | 9 | 4.70 |
Cristinel Ababei | 2 | 281 | 24.54 |