Title
Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application.
Abstract
In this paper, a novel radiation-hardened 14-transistor SRAM bitcell with speed and power optimized [radiation-hardened with speed and power optimized (RSP)-14T] for space application is proposed. By circuit- and layout-level optimization design in a 65-nm CMOS technology, the 3-D TCAD mixed-mode simulation results show that the novel structure is provided with increased resilience to single-event upset as well as single-event–multiple-node upsets due to the charge sharing among OFF-transistors. Moreover, the HSPICE simulation results show that the write speed and power consumption of the proposed RSP-14T are improved by ~65% and ~50%, respectively, compared with those of the radiation hardened design (RHD)-12T memory cell.
Year
DOI
Venue
2019
10.1109/TVLSI.2018.2879341
IEEE Trans. VLSI Syst.
Keywords
Field
DocType
Transistors,Transient analysis,Single event upsets,Layout,Integrated circuit modeling,SRAM cells
Computer science,Static random-access memory,CMOS,Electronic engineering,Charge sharing,Upset,Transistor,Radiation,Power consumption,Memory cell
Journal
Volume
Issue
ISSN
27
2
1063-8210
Citations 
PageRank 
References 
7
0.57
0
Authors
9
Name
Order
Citations
PageRank
Chunyu Peng13010.29
Jiati Huang270.57
Changyong Liu3112.79
Qiang Zhao471.24
Songsong Xiao5101.98
Xiulong Wu6175.82
Zhiting Lin7112.67
JunNing Chen8195.75
Xuan Zeng940875.96