Title
Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects
Abstract
<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Editor’s note:</italic> This work aims to predict bounds on bit-error-rate performance of highspeed interconnects. The novelty lies in the characterization of timing jitter to achieve more accurate modeling of such interconnects. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">—Sudeep Pasricha, Colorado State University</italic>
Year
DOI
Venue
2019
10.1109/MDAT.2018.2865455
IEEE Design & Test
Keywords
Field
DocType
Timing jitter,Three-dimensional displays,Signal to noise ratio,Integrated circuit interconnections,Receivers,Solid modeling
Computer science,Signal-to-noise ratio,Electronic engineering,Solid modeling,Novelty,Jitter,Bit error rate
Journal
Volume
Issue
ISSN
36
1
2168-2356
Citations 
PageRank 
References 
0
0.34
0
Authors
4
Name
Order
Citations
PageRank
L. Pizano-Escalante100.34
Longoria-Gandara Omar212.06
R. Parra-Michel3235.19
F. Pena-Campos431.77