Paper Info
Title
Photodiode sensitivity measurement methodology using low light intensity for optically reconfigurable gate arrays
Abstract
An optically reconfigurable gate array (ORGA), an alternative technology to commercially available field programmable gate arrays (FPGAs), is much faster. Moreover, it can operate in radiation-rich environments. An ORGA uses a laser array, a holographic memory, and an ORGA-VLSI chip including a fine-grained programmable gate array. Many configuration contexts can be stored on the holographic memory and can be addressed by the laser array. The ORGA-VLSI can be programmed optically through numerous photodiodes. To realize faster configuration, measuring the variation of photodiode characteristics is extremely important. Nevertheless, photodiode characteristics have not been estimated to date because measurements must be done using its programmable gate array such that the measurement results include a photodiode response time and propagation delay on the programmable gate array. They cannot be classified clearly. Therefore, this paper proposes a photodiode sensitivity measurement method using low light intensity. Results show that the measurement methodology can remove the propagation delay factor and can extract photodiode sensitivity.
Year
DOI
Venue
2016
10.1109/ICCSE.2016.7581623
2016 11th International Conference on Computer Science & Education (ICCSE)
Keywords
Field
DocType
photodiode sensitivity measurement,low light intensity,optically reconfigurable gate arrays,field programmable gate arrays,FPGA,radiation-rich environments,laser array,holographic memory,ORGA-VLSI chip
Holography,Logic gate,Propagation delay,Computer science,Field-programmable gate array,Chip,Gate array,Artificial intelligence,Optoelectronics,Machine learning,Macrocell array,Photodiode
Conference
ISSN
ISBN
Citations 
2471-6146
978-1-5090-2219-9
0
PageRank 
References 
Authors
0.34
2
2
Name
Order
Citations
PageRank
Bharat Ramanathan100.34
Minoru Watanabe213743.46