Paper Info
Title
An automated CAD tool for rapid technology characterization
Abstract
In this paper an automated CAD tool for rapid technology characterization is presented. The proposed methodology fills the gap found in old, as well as, new IC desgin methdologies technology. The tool allows the user doing a rapid characterization for different devices models available in a technology. The tool is based on a pre-defined suite of test-benches in addition to SKILL code and OCEAN script to allow seamless integration of the tool in the design environment. Finally, a design example is presented using 130 nm CMOS technology using the tool; results are shown for MOSFET devices characterization.
Year
DOI
Venue
2017
10.1109/ICM.2017.8268853
2017 29th International Conference on Microelectronics (ICM)
Keywords
Field
DocType
CMOS technology,MOSFET devices characterization,rapid characterization,IC desgin methdologies technology,rapid technology characterization,automated CAD tool,size 130.0 nm
Cad tools,Suite,Computer science,Electronic engineering,CMOS,Embedded system
Conference
ISSN
ISBN
Citations 
2159-1679
978-1-5386-4050-0
0
PageRank 
References 
Authors
0.34
4
3
Name
Order
Citations
PageRank
Omar Elgabry100.34
Faisal A. Hussien211.79
Ahmed Nader Mohieldin34710.58