Abstract | ||
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This paper describes how signal processing techniques applied in embedded measurement systems are changing impedance spectroscopy. The rapid growth in microprocessor/microcontroller capabilities has led to the increase integration of advanced signal processing algorithms in embedded systems that can measure impedance frequency responses and process, in the device, the results to obtain relevant system or device characteristics without the need for an external computer. |
Year | DOI | Venue |
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2018 | 10.1109/I2MTC.2018.8409603 | 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) |
Keywords | Field | DocType |
impedance spectroscopy,signal processing algorithms,measurement of electrical quantities | Signal processing,System of measurement,Microprocessor,Electronic engineering,Electrical impedance,Resistor,Dielectric spectroscopy,Microcontroller,Engineering,Signal processing algorithms | Conference |
ISBN | Citations | PageRank |
978-1-5386-2223-0 | 0 | 0.34 |
References | Authors | |
11 | 1 |
Name | Order | Citations | PageRank |
---|---|---|---|
Pedro M. Ramos | 1 | 115 | 17.91 |