Title
How signal processing is changing impedance spectroscopy
Abstract
This paper describes how signal processing techniques applied in embedded measurement systems are changing impedance spectroscopy. The rapid growth in microprocessor/microcontroller capabilities has led to the increase integration of advanced signal processing algorithms in embedded systems that can measure impedance frequency responses and process, in the device, the results to obtain relevant system or device characteristics without the need for an external computer.
Year
DOI
Venue
2018
10.1109/I2MTC.2018.8409603
2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Keywords
Field
DocType
impedance spectroscopy,signal processing algorithms,measurement of electrical quantities
Signal processing,System of measurement,Microprocessor,Electronic engineering,Electrical impedance,Resistor,Dielectric spectroscopy,Microcontroller,Engineering,Signal processing algorithms
Conference
ISBN
Citations 
PageRank 
978-1-5386-2223-0
0
0.34
References 
Authors
11
1
Name
Order
Citations
PageRank
Pedro M. Ramos111517.91