Name
Title | ||
|---|---|---|
Non-fifty ohm X-parameter model measurement system for nonlinear amplifier application |
Abstract | ||
|---|---|---|
This paper describes the non-fifty ohm X-parameter model measurement system for nonlinear amplifier application so that RF designers can utilize the X-parameter model to design a nonlinear amplifier in a non-fifty impedance situation. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/I2MTC.2018.8409612 | 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) |
Keywords | Field | DocType |
Non-fifty ohm X-parameter,measurement system,amplifier | System of measurement,Ohm,Electronic engineering,Electrical impedance,Engineering,Nonlinear amplifier,Electricity generation,Calibration | Conference |
ISBN | Citations | PageRank |
978-1-5386-2223-0 | 0 | 0.34 |
References | Authors | |
0 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hsu-Feng Hsiao | 1 | 0 | 0.34 |
| Chih-Ho Tu | 2 | 0 | 0.34 |
| dachiang chang | 3 | 6 | 4.99 |