Title
Sub-Thermionic Steep Switching in Hole-Doped WSe2 Transistors
Abstract
Decreasing the subthreshold swing (SS) of field-effect transistors (FETs) to sub-60 mV/decade at room temperature can enable next-generation low-power electronics [1]. Here, we demonstrate steep switching and high on-current (ION ≈ 400μA/μm) in non-uniformly hole-doped WSe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> transistors. By setting up large lateral electric field gradients through spatial variation of doping, we deduce that the abrupt switching behavior is consistent with avalanche (impact ionization [2]) of charge carriers, opening up a new approach to achieve low-power transistors based on ultra-thin 2D materials.
Year
DOI
Venue
2018
10.1109/DRC.2018.8442237
2018 76th Device Research Conference (DRC)
Keywords
DocType
ISSN
lateral electric field gradients,abrupt switching behavior,low-power transistors,ultra-thin 2D materials,sub-thermionic steep switching,subthreshold swing,field-effect transistors,next-generation low-power electronics,spatial variation,impact ionization,charge carriers,hole-doped WSe2 transistors,WSe2
Conference
1548-3770
ISBN
Citations 
PageRank 
978-1-5386-3029-7
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Connor J. McClellan101.01
Eilam Yalon201.69
Lili Cai300.34
Saurabh V. Suryavanshi400.34
Xiaolin Zheng500.34
Eric Pop65012.07